Damage and Material Analyses
In the event of a component failure, the search for the cause of the damage is the essential factor in order to ensure, that production, or the system can continue to operate safely in the future.
Our team of experienced materials testers, materials scientists and our professional network will help you to investigate the causes of component or system damage. X-ray fluorescence analysis (SEM) and
optical spark emission spectrometry (OES).
Would you like to find out more about our range of services or do you have a specific request?
Contact us without obligation.